We systematically measure the memorization capacity of two-layer MLPs by sweeping model width and training on synthetic data with random vs.\ structured labels.
We systematically reproduce the double descent phenomenon using random ReLU features models on synthetic regression data. Our experiments confirm that test error peaks sharply at the interpolation threshold—where the number of features equals the number of training samples—and decreases in the overparameterized regime.
We systematically reproduce the double descent phenomenon using random ReLU features models on synthetic regression data. Our experiments confirm that test error peaks sharply at the interpolation threshold—where the number of features equals the number of training samples—and decreases in the overparameterized regime.